Scitech Precision now has access to a state of the art optical profilometer, Bruker ContourX-200. This is used for non-contact 3D surface metrology. We use this to measure thin-film coatings pinholes and the roughness of parts down to a few nanometers Ra.

Scitech Precision now has access to a new Bruker DektakXT stylus profilometer. We use this to measure the thickness of all our thin-film coatings and is the main workhorse characterization kit of the lab. The profilometer is capable of 4 angstroms accuracy on step height measurements.